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Challenges of the evolving 3G technology: some challenges arise with the introduction of an enhanced air interface.(WIRELESS TEST) : An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Thomson Gale on April 1, 2006. The length of the article is 2487 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Challenges of the evolving 3G technology: some challenges arise with the introduction of an enhanced air interface.(WIRELESS TEST) Author: Nick Hallam-Baker Publication:EE-Evaluation Engineering (Magazine/Journal) Date: April 1, 2006 Publisher: Thomson Gale Volume: 45 Issue: 4 Page: 28(4) Distributed by Thomson Gale.
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Drilling down into FPGAs: how do they get a complete logic analyzer in that tiny package?(LOGIC ANALYSIS) : An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Thomson Gale on April 1, 2006. The length of the article is 3596 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Drilling down into FPGAs: how do they get a complete logic analyzer in that tiny package?(LOGIC ANALYSIS) Author: Tom Lecklider Publication:EE-Evaluation Engineering (Magazine/Journal) Date: April 1, 2006 Publisher: Thomson Gale Volume: 45 Issue: 4 Page: 18(6) Distributed by Thomson Gale.
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Does ambient noise cancellation work? We live in a jumble of man-made noise that threatens to overwhelm any measurements we want to take in unscreened ... An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on January 1, 2005. The length of the article is 2350 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Does ambient noise cancellation work? We live in a jumble of man-made noise that threatens to overwhelm any measurements we want to take in unscreened environments.(EMC TEST) Author: David Mawdsley Publication:EE-Evaluation Engineering (Refereed) Date: January 1, 2005 Publisher: Nelson Publishing Volume: 44 Issue: 1 Page: 48(5) Distributed by Thomson Gale.
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A look at onboard intelligence. (PC-Based Test).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on April 1, 2002. The length of the article is 2044 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: A look at onboard intelligence. (PC-Based Test). Author: Neil Fenichel Publication:EE-Evaluation Engineering (Refereed) Date: April 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 4 Page: 30(5) Distributed by Thomson Gale.
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Data Acquisition. (PC-based Test Product Guide).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on February 1, 2002. The length of the article is 6811 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Data Acquisition. (PC-based Test Product Guide). Publication:EE-Evaluation Engineering (Refereed) Date: February 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 2 Page: 40(5) Distributed by Thomson Gale.
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The holy grail of ATE? (Editorial).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on September 1, 2002. The length of the article is 474 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: The holy grail of ATE? (Editorial). Author: Paul Milo Publication:EE-Evaluation Engineering (Refereed) Date: September 1, 2002 Publisher: Nelson Publishing Volume: 41 Issue: 9 Page: 8(1) Distributed by Thomson Gale.
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Test vector compression makes more from less: depreciated ATE and compressed patterns make IC testing almost free. (Design for Testability).: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on June 1, 2003. The length of the article is 2947 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Test vector compression makes more from less: depreciated ATE and compressed patterns make IC testing almost free. (Design for Testability). Author: Tom Lecklider Publication:EE-Evaluation Engineering (Refereed) Date: June 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 6 Page: 42(5) Distributed by Thomson Gale.
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How to measure power factor: a tutorial.(Power Analyzers): An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on September 1, 2003. The length of the article is 971 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: How to measure power factor: a tutorial.(Power Analyzers) Author: Jon Francis Publication:EE-Evaluation Engineering (Refereed) Date: September 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 9 Page: 22(2) Distributed by Thomson Gale.
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Separating one micron from another: an accurate probe station lets you count the atoms inside a device--well, almost.(Wafer Test): An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on September 1, 2003. The length of the article is 2447 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Separating one micron from another: an accurate probe station lets you count the atoms inside a device--well, almost.(Wafer Test) Author: Tom Lecklider Publication:EE-Evaluation Engineering (Refereed) Date: September 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 9 Page: 26(6) Distributed by Thomson Gale.
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Environmental Test Buyers Guide.: An article from: EE-Evaluation Engineering
This digital document is an article from EE-Evaluation Engineering, published by Nelson Publishing on August 1, 2003. The length of the article is 3209 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser. Citation DetailsTitle: Environmental Test Buyers Guide. Publication:EE-Evaluation Engineering (Refereed) Date: August 1, 2003 Publisher: Nelson Publishing Volume: 42 Issue: 8 Page: 40(6) Distributed by Thomson Gale.
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